Strain mapping at nanometer resolution using advanced nano-beam electron diffraction
نویسندگان
چکیده
منابع مشابه
Electron Diffraction with Ten Nanometer Beam Size for Strain Analysis of Nanodevices
A method to perform nano-beam diffraction (NBD) in a transmission electron microscope with high spatial resolution and low convergence angle is proposed. It is based on the use of a properly fabricated condenser aperture of 1 micron in diameter, which allows an electron beam about 10 nm in size to be focused on the sample, with a convergence angle in the 0.1 mrad range. Examples of NBD patterns...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2015
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.4922994